menu▼ MICRO PROBER This equipment is to measure electrical characteristic for semiconductor wafer, PCB, materials. We provide accessories for manipulator, probe, microscopes, shield cases, etc. <K-157MP Simple type> Sample size〜４ inchφ details <K-157MP150 Simple type> Sample size〜６ inchφ details <K-160MP> Sample size〜４ inchφ details <K-160MW> Sample size〜４ inchφ details <K-160MPH/MWH> Sample size〜４ inchφ with Heater stage details <K-163MW1> Sample size〜６ inchφ Both for electric driven and manual details <K-560RM400> Sample size〜１２ inchφ/400□ details Manipulator <K-15MT> <K-15MTS> <K-15MX> X,Y,Z axes fine adjustment 5mm 250μm/turn Y axis rough adjustment 16mm θaxis rough adjustment 90° X,Y,Z axes fine adjustment mechanics Devetail groove mechnics Dimension W 38×D 120×H 65mm Weight Approx.260g X,Y,Z axes fine adjustment 6mm 250μm/turn Y axis rough adjustment 16mm θaxis rough adjustment 90° X,Y,Z axes fine adjustment mechanics Slide bearing mechnics Dimension W 55×D 130×H 73mm Weight Approx. 400g X,Y,Z axes fine adjustment 10mm 500μm/turn X,Y,Z axes fine adjustment 1mm 20μm/turn X,Y,Z axes fine adjustment mechanics Slide bearing mechanics Dimension W 90×D 130×H 86mm Weight Approx. 700g Holder & Cable <L type> <LL type> <BNC Cable> Probe Material Model size NeedlepointR Tungsten carbide KM2 30mmL×0.7φ×10° 2μ Tungsten carbide KM5 30mmL×0.7φ×10° 5μ Tungsten carbide KM10 30mmL×0.7φ×10° 10μ Tungsten carbide KM30 30mmL×0.7φ×10° 30μ Tungsten carbideト KM50 30mmL×0.7φ×10° 50μ Silver KM30Ag 30mmL×0.7φ×10° 30μ Platinum KM30Pt 30mmL×0.7φ×10° 30μ ＜Example of use＞ Enlargement UP Kyowa Riken Co., Ltd. 3-37-3 Izumi, Suginami-Ku, Tokyo 168-0063, Japan TEL　０３（３３２１）９９１１　　FAX　０３（３３２１）９９１７ E-MAIL:sales@kyowariken.co.jp